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STEREO ZOOM MICROSCOPE RAD-SZ 6745/ RAD-SZ 6745TR / RAD-SZ 6745 ESD
Optical system of RAD-SZ 6745 series stereo zoom microscopes produce sharp and crystal clear images with excellent flatness and contrast. The images are brighter and more distinct even as the periphery of the field of view.
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Semiconductor Wafer Inspection Microscope
Equipped with varisized Wafer holders (Including 6/8/12 inches), RAD-WIM 8 and RAD-WIM 12 is professionally applied for wafer and flat panel display detection, maximally supports for dia 300mm of wafer and 17'' of FPD. More comfortable, flexible and quicker operation is available with upgraded ergonomics design.
Equipped with varisized Wafer holders (Including 6/8/12 inches), RAD-WIM 8 and RAD-WIM 12 is professionally applied for wafer and flat panel display detection, maximally supports for dia 300mm of wafer and 17'' of FPD. More comfortable, flexible and quicker operation is available with upgraded ergonomics design.
