Features- All-around darkfield illumination providing ten times greater detectability for object-of-interest, at sub-micron level, over conventional RDF illumination techniques.
- Compatible with single objective and WDI’s three-lens BF/DF lens changer allowing for use in variety of applications.
- Dedicated PFABUS™ COB controller, providing power and controls for intensity, timing, and mode of operation including Direct Current (DC), Pulse Width Modulation (PWM) along with two external trigger modes (Pulse Follow and Pulse Trigger).
ApplicationsDarkfield illumination in microscopy that provides great contract compared to brightfield microscopy and applications where specimens are translucent, lack significant pigmentation, or are otherwise low in contrast benefit from this technique. Some specific applications include study of thin or transparent samples, observation of live unstained specimen, detection of small particles and surface defects, and material science.
Inquiry - Reflected Darkfield